Current trends in Optical and X-Ray metrologies of key enabling nanomaterials/devices for the Ubiquitous Society, renewable energy and health (OptoX NANO),
Okayama, Japan, 19-23th November, 2017

This symposium will commemorate the 60th anniversary of Japan-Ireland Diplomatic Relations

 


The major effort scientific effort worldwide towards the development of novel key enabling materials for the emerging technologies of Ubiquitous Society, renewable energy and health requires the development of appropiate characterisation tools and methodologies able to work at the nanoscale level. This international symposium is intended to give an overview of the current status and future trends of optical and x-ray metrology for key enabling nanoscale material characterisation for these emerging technologies. In this symposium, these methods will be discussed with particular attention paid to their application, as well as their limitations and complementarities.
In addittion, the optical and x-ray techniques as analytical techniques for art and culture heritage preservation will be explored.
 
Symposium Organisers:
 Dr. Mircea Modreanu, Tyndall National Institute-University College Cork, Ireland
 Prof. Toshihiko Kiwa, Okayama University, Japan
 Prof. Olivier Durand, UMR FOTON, CNRS, INSA, Rennes, France
 

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Important Deadlines

  • 23 Sep., 2017: Post Deadline submission open by
  • 1 Sep., 2017:New Abstract submission deadline
  • 1 Aug., 2017: Abstract submission deadline
  • 1 Oct., 2017 1 Sep., 2017: Early regsitration with discount prices

Hot topics to be covered by the symposium

・Recent advances in optical and X-ray instrumentation (Mueller matrix ellipsometry, Infrared and THz ellipsometry, THz spectroscopy and X-ray diffuse scattering)
・Novel imaging and mapping capabilities and high spatial resolution (e.g., NSOM techniques, AFM-Raman,  SERS,  TERS and Nano-IR)
・Recent development, using X-ray Synchrotron sources, of new X-ray scattering techniques for non-destructive characterization of thin-layered materials and of micrometer-sized (or smaller) objects.
・Emerging X-ray Techniques:a)Coherent  imaging;b) Focussed beams<10 nm scanning probes; c)Ultrafast timing fs (FEL) 
・Optical pump-probe techniques and spatially resolved techniques for the investigation of small objects and micro-devices
・In-situ and real-time characterization (MBE, VPE, ALD, CVD, PVD)
・Characterisation of complex materials and thin films: graphene, graphene oxide, 2D semiconductors materials, nanotubes and nanowires; nano-porous materials and composites;
・Dielectrics and ceramics: low- and high-k materials; transparent semiconductors, ferroelectrics, ferromagnetics, and multiferroics; materials for high performance batteries
・Nanostructures, photonic crystals, and metamaterials; plasmons at interfaces and in nanostructured materials
・Solar Cell device characterization using L-I-V, Quantum Efficiency measurement, cathodoluminescence, photoluminescence and electroluminescence based techniques, including mapping techniques, carrier diffusion length measurements and Hyperspectral imaging
・Optical and X-ray analytical techniques for health and life sciences and for art and culture heritage preservation

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