@VRޗ̉ȊwƋZptH[2018@
@@The Forum on the Science and Technology of Silicon Materials 2018



@Gudrun Kissinger @@@@IHP, Germany
@ "
Paper title: "

@
Eddy Simoen        @@@IMEC, Belgium
@
"Metal contamination in semiconductor devices:
     a neveer ending story?
"

@
Michael Sluydts          Ghent Univ., Belgium
@
"The road to accuracy: a comparison of state-of-the-art
    ab initio methods
"

@
Simona Binetti  @@@Univ. Milano-Bicocca, Italy
@
"Photoluminescence and infrared spectroscopy for impurities
     identification in silicon for photovoltaic applications
"

@
Gerhard Wachutka @@Tech. Univ. Munich, Germany
  "Virtual Prototyping of High Power Devices and Modules"



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