シリコン材料の科学と技術フォーラム2018 
  The Forum on the Science and Technology of Silicon Materials 2018


 Gudrun Kissinger    IHP, Germany
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Paper title: "

 
Eddy Simoen          IMEC, Belgium
 
"Metal contamination in semiconductor devices: a neveer ending story?"

 
Michael Sluydts    Ghent Univ., Belgium
 
"The road to accuracy: a comparison of state-of-the-art ab initio methods"

 
Simona Binetti      Univ. Milano-Bicocca, Italy
  "
Photoluminescence and infrared spectroscopy
    for impurities identification in silicon for photovoltaic applications
"


 
Gerhard Wachutka   Tech. Univ. Munich, Germany
  "Virtual Prototyping of High Power Devices and Modules"



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